Polymeric materials show organisation phenomena over various length
scales. A comprehensive structural analysis
requires experimental methods covering length scales from interatomic
distances up to macroscopic dimensions.
we make use of various scattering techniques to detect and
characterize structures on a Å to μm length scale.
- Small and Wide Angle X-Ray Scattering (SAXS, WAXS)
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Structure determination from the Å length scale up to approx. 20 nm in
materials such as complex liquids, nanoparticles, semicrystalline polymers,
nanocomposits, and suspensions.
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SAXS pattern of an Ionic Liquid at 50°C (left) and 190°C (right).
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For X-ray scattering we are operating a powder diffractometer and a SAXS/WAXS
instrument equipped with 2D detectors to investigate scattering from anisotropic
samples.
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- X-Ray Reflectivity (XRR)
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Determination of perpendicular refractive index profiles through thin
films of approx. 5 nm to 100 nm thicknesses. Applications include the
measurement of thickness and roughness of polymer coatings.
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(a) Sketch of an X-ray reflectivity experiment.
(b) XRR model calculation of a single layer on top of a semi-infinite substrate.
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- X-Ray Powder Diffraction
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Structural characterization of microcrystalline samples.
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M. Mezger, S. Schramm, H. Schröder, H. Reichert, M. Deutsch, E.J. De
Souza, J.S. Okasinski, B.M. Ocko, V. Honkimäki, and H. Dosch:
Layering of [BMIM]+-based ionic liquids at a charged sapphire interface.
J. Chem. Phys. 131, 094701 (2009).
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M. Mezger, S. Schöder, H. Reichert, H. Schröder, J. Okasinski, V.
Honkimäki, J. Ralston, J. Bilgram, R. Roth, and H. Dosch:
Water and ice in contact with OTS functionalized surfaces: A high
resolution x-ray reflectivity study.
J. Chem. Phys. 128, 244705 (2008).
- B. Inci, I. Lieberwirth, W. Steffen, M. Mezger, R. Graf, K. Landfester, K.B. Wagener:
Decreasing the Alkyl Branch Frequency in Precision Polyethylene: Effect of Alkyl Branch Size on
Nanoscale Morphology.
Macromolecules 45, 3367 (2012).
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