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Dimension 3100

SPM techniques options
  • Measurement on large samples (max.diam.15 cm)
  • Tapping Mode
  • Contact Mode AFM
  • Force-Distance Measurements
  • Force-Volume Measurements
Scanner
  • X,Y 100µm x 100µm
  • Z 5.5 µm

letzte Änderung: 7.4.2006
Contact: Uwe Rietzler (Tel: 469)