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Multimode AFM with NanoScope IIIa controller

SPM techniques options
  • Tapping Mode
  • Contact Mode AFM
  • Force-Distance Measurements
  • Force-Volume Measurements
Scanner
  • no vertical engage scanner
  • A 1µm x 1µm
  • E 10µm x 10µm
  • J 100µm x 100µm

letzte Änderung: 7.4.2006
Contact: Uwe Rietzler (Tel: 469)