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MM STM low current (fA) STM

SPM techniques options
  • Low current (fA) STM
  • Tapping Mode
  • Phase Imaging
  • Contact Mode AFM
  • Force-Distance Measurements
  • Force-Volume Measurements
Scanner
  • Big sample size
  • vertical engage scanner
  • A 1µm x 1µm
  • E 10µm x 10µm
  • J 100µm x 100µm
Measurement Examples
  • atomic characterisation on conductive substrates
  • self assembled monolayers
  • single molecules

letzte Änderung: 7.4.2006
Contact: Uwe Rietzler (Tel: 469)