Publikationen von Ronald Ulbricht

Purz, T. L.; Hipsley, B. T.; Martin, E. W.; Ulbricht, R.; Cundiff, S. T.: Rapid multiplex ultrafast nonlinear microscopy for material characterization. Optics Express 30 (25), S. 45008 - 45019 (2022)

Younesi, A. T.; Ulbricht, R.: Broadband transient absorption spectroscopy using an incoherent white-light source as probe. Optics Express 30 (21), 467483, S. 38896 - 38906 (2022)

Day, M. W.; Bates, K. M.; Smallwood, C. L.; Owen, R. C.; Schröder, T.; Bielejec, E.; Ulbricht, R.; Cundiff, S. T.: Coherent Interactions between Silicon-Vacancy Centers in Diamond. Physical Review Letters 128 (20), 203603 (2022)

Bates, K. M.; Day, M. W.; Smallwood, C. L.; Owen, R. C.; Schröder, T.; Bielejec, E.; Ulbricht, R.; Cundiff, S. T.: Using silicon-vacancy centers in diamond to probe the full strain tensor. Journal of Applied Physics 130 (2), 024301 (2021)

Liu, A.; Cundiff, S. T.; Almeida, D. B.; Ulbricht, R.: Spectral broadening and ultrafast dynamics of a nitrogen-vacancy center ensemble in diamond. Materials for Quantum Technology 1 (2), 025002 (2021)

Smallwood, C. L.; Ulbricht, R.; Day, M. W.; Schröder, T.; Bates, K. M.; Autry, T. M.; Diederich, G.; Bielejec, E.; Siemens, M. E.; Cundiff, S. T.: Hidden Silicon-Vacancy Centers in Diamond. Physical Review Letters 126 (21), 213601 (2021)

Ulbricht, R.; Pijpers, J. J. H.; Groeneveld, E.; Koole, R.; Donega, C. D.; Vanmaekelbergh, D.; Delerue, C.; Allan, G.; Bonn, M.: Loosening Quantum Confinement: Observation of Real Conductivity Caused by Hole Polarons in Semiconductor Nanocrystals Smaller than the Bohr Radius. Nano Letters 12 (9), S. 4937 - 4942 (2012)

Day, M. W.; Bates, K. M.; Smallwood, C. L.; Owen, R. C.; Ulbricht, R.; Cundiff, a. S. T.: Dipole-Dipole Interactions Between Pairs of Silicon-Vacancy Centers in Diamond. In: CLEO: QELS_Fundamental Science, paper FTh4L.6. 2021 Conference on Lasers and Electro-Optics, San Jose, California, United States , 09. Mai 2021 - 14. Mai 2021. Optica Publishing Group, Washington, D.C., USA (2021)

Bates, K.M.; Day, M.W.; Smallwood, C.L.; Ulbricht, R.; Autry, T.M.; Owen, R.C.; Diederich, G.; Schroder, T.; Bielejec, E.; Siemens, M.E. et al.; Cundiff, S.T.: Measuring the Diamond Strain Tensor with Silicon-Vacancy Centers. In: 2020 Conference on Lasers and Electro-Optics, CLEO, Bd. 2020, 9192157. CLEO 2020 : 2020 Conference on Lasers and Electro-Optics, San Jose, United States, 10. Mai 2020 - 15. Mai 2020. IEEE, Institute of Electrical and Electronics Engineers Inc. (2020)