Publikationen von Ronald Ulbricht
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Zeitschriftenartikel (7)
2022
Zeitschriftenartikel
30 (25), S. 45008 - 45019 (2022)
Rapid multiplex ultrafast nonlinear microscopy for material characterization. Optics Express
Zeitschriftenartikel
30 (21), 467483, S. 38896 - 38906 (2022)
Broadband transient absorption spectroscopy using an incoherent white-light source as probe. Optics Express
Zeitschriftenartikel
128 (20), 203603 (2022)
Coherent Interactions between Silicon-Vacancy Centers in Diamond. Physical Review Letters 2021
Zeitschriftenartikel
130 (2), 024301 (2021)
Using silicon-vacancy centers in diamond to probe the full strain tensor. Journal of Applied Physics
Zeitschriftenartikel
1 (2), 025002 (2021)
Spectral broadening and ultrafast dynamics of a nitrogen-vacancy center ensemble in diamond. Materials for Quantum Technology
Zeitschriftenartikel
126 (21), 213601 (2021)
Hidden Silicon-Vacancy Centers in Diamond. Physical Review Letters 2012
Zeitschriftenartikel
12 (9), S. 4937 - 4942 (2012)
Loosening Quantum Confinement: Observation of Real Conductivity Caused by Hole Polarons in Semiconductor Nanocrystals Smaller than the Bohr Radius. Nano Letters Konferenzbeitrag (2)
2021
Konferenzbeitrag
Dipole-Dipole Interactions Between Pairs of Silicon-Vacancy Centers in Diamond. In: 2021 Conference on Lasers and Electro-Optics (CLEO): proceedings: virtual conference, May 9-14, 2021: CLEO 2021, FTh4L.6. Conference on Lasers and Electro-Optics. CLEO: QELS_Fundamental Science 2021. From the session Nonlinear and THz Spectroscopy for Studying Quantum Materials (FTh4L), San Jose, California, United States , 09. Mai 2021 - 14. Mai 2021. IEEE, Piscataway, NJ (2021)
2020
Konferenzbeitrag
2020, 9192157. Conference on Lasers and Electro-Optics. CLEO: QELS_Fundamental Science 2020. From the session Single Color Centers in Wide-Bandgap Semiconductors (FTu3D), Washington, DC, United States, 10. Mai 2020 - 15. Mai 2020. IEEE, Piscataway, NJ (2020)
Measuring the Diamond Strain Tensor with Silicon-Vacancy Centers. In: 2020 Conference on Lasers and Electro-Optics (CLEO): proceedings: San Jose, California, USA, 10-15 May 2020, Bd.