Structural analysis 

Solid-state NMR

In the NMR service of MPI-P two scientists supported by 3 technicians analyze approximately 30,000 – 40,000 samples per year. NMR combines a unique chemical selectivity with the potential to probe, independently spatial and through bond proximities, between a broad variety of different nuclear spin species such as ¹H, ²H, ⁷Li, ¹¹B, ¹³C, ¹⁵N, ¹⁹F, ²⁹Si, ³¹P, etc. As a result the chemical as well as 3D molecular structure of novel materials can be determined. The joint solution and solid-state NMR facilities provide chemical characterization of novel functional materials, and aim to elucidate the molecular origin of the special physical properties of these materials based on the site selective observation of the packing and the dynamic behavior on the molecular level. 


The supramolecular organization in bulk and in thin films can be investigated by two-dimensional wide-angle X-ray scattering (2D-WAXS) and grazing-incidence wide-angle X-ray scattering (GIWAXS), respectively. The bulk measurement are performed on the 1 dimensional fibre prepared by mechanical extrusion in respect to the thin films which can be deposited on rigid and flexible substrate by thermal evaporation or solution processing. Both X-ray methods give valuable information about molecular organization of the low and high molecular weight organic (semiconductors, biomolecules) and inorganic (perovskite) materials. Variation in the chemical structure, substituent position and role of deposition procedure can be easily determined by 2D-WAXS and GIWAXS experiments.  

AFM and Optical Film characterization 

In addition to surface characterization with atomic force microscopy, there is also a setup for controlled solvent-vapor exposure, equipped with in-situ reflectometry measurements for thin-film post-treatment, as well as studying polymer-solvent interaction. 

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