Publikationen | Dr. Ulrike Kraft

Simatos, D.; Spalek, L. J.; Kraft, U.; Nikolka, M.; Jiao, X.; McNeill, C. R.; Venkateshvaran, D.; Sirringhaus, H.: The effect of the dielectric end groups on the positive bias stress stability of N2200 organic field effect transistors. APL Materials 9 (4), 041113 (2021)