Publikationen von M. Gelbert

Gelbert, M.; Biesalski, M.; Rühe, J.; Johannsmann, D.: Collapse of Polyelectrolyte Brushes Probed by Noise Analysis of a Scanning Force Microscope Cantilever. Langmuir 16, S. 5774 - 5784 (2000)

Gelbert, M.; Roters, A.; Schimmel, M.; Rühe, J.; Johannsmann, D.: Viscoelastic spectra of soft polymer interfaces obtained by noise analysis of AFM cantilevers. Surface and Interface Analysis 27, S. 572 - 577 (1999)

Roters, A.; Gelbert, M.; Schimmel, M.; Rühe, J.; Johannsmann, D.: Static and dynamic profiles of tethered polymer layers probed by analyzing the noise of an atomic force microscope. Physical Review E 56 (3), S. 3256 - 3264 (1997)