Dr. Rüdiger Berger
Rüdiger Berger is focusing on Scanning Probe Microscopy (SPM) methods for characterization of surface and interface properties. He operates and organizes the service lab for SPM with ten different microscopes from all major companies and more than 40 users. His specialty is the investigation of electrical properties of surfaces at the nanometer scale (Kelvin and Conducting Probe Microscopy). The latter is important for charge transport in organic and perovskite solar cells and battery materiuals. Based on SPM and optical tweezers methods novel instruments were developed for the investigation of liquid drops and force measurements at hydrostatic pressures up to 6 kbar. In addition, a micromechanical sensor technique is explored for material composition of tiny samples.
Rüdiger Berger studied physics at the Friedrich-Alexander University of Erlangen-Nürnberg. He got his diploma in Physics in 1994 in the field of high Tc-superconductors where he worked on imaging and manipulation methods using Scanning Probe Microscopy (SPM). Then he moved to Switzerland where he made his PhD thesis and a PostDoc in the field of micromechanical sensors in the group of Ch. Gerber and J. Gimzewski at the IBM Zurich Research Laboratory. 1998 he joined the Analysis Laboratory at the IBM Deutschland Speichersysteme GmbH (Mainz). Here he worked on the automation of test systems, in-situ flight height control and the investigation of ion-beam structuring of magnetic materials. Since October 2002 Rüdiger Berger is working at the MPI for Polymer Research.